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CAN总线隔离芯片iso1050_C

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CAN总线隔离芯片iso1050_C

1 Texas< Instruments特性5000Vrms隔离(IS01050DW)2500-Vrms隔离(IS01050DUB和IS01050LDW)故障安全输出低冋路延迟:150ns (典型值)50kV/ps典型静态抗扰度符介或者超过ISO11898规擀-27V至40V的总线故障保护主超时功能IEC 60747-5-2 (VDE 0884,修订版本2) & IEC 61010-1已通过检验UL 1577双巫保护已通过检验:更篡细3请见管理 信息IEC 60601-1 (医疗用)和CSA已通过检验5 KVrms针对 EN/UL/CSA 60950-1 (IS01050DW) 根据TUV认吋的增强醴隔离具仃5V容限的3.3输入额定1作电压卜典熨值为25年便用好命到特性(参 见应用报告SLLA197和Figure 15)应用范围CAN敎抓总线工业自动化-DeviceNet数据总线-CANopen数据总线-CANKingdom数据总线医疗扫描和成像安防系统电信基站状态和控制加热,通风和空调坏境系统(HVAC)楼宇口动化IS01050IS01050LZHCS321E-JUNE 2009-REVISED DECEMBER 2011独立的控制器局域网(CAN)收发器IS01050, ISO1D50LCopyright © 2009-2011, Texas Instruments IncorporatedEnglish Data Sheet: SLLS983Copyright © 2009-2011, Texas Instruments IncorporatedEnglish Data Sheet: SLLS983说明IS01050是一款电镀隔离的隔离式CAN转发器,此转发器符合或者优于I SO11898标准的技术规范。此器件的彼 一个硅极管(SiO2)绝缘隔栅分开的逻悅输入和输出缓冲器,此绝缘隔栅为说明第一段中的IS01050DW和2500 Vrms用于ISO1050DUB和ISO1050LDW 9隔离式电源一起使用,此器件町防止数据总线或者其它电路卜.的噪 音电流进入本地接地并千扰和损坏敏感电路。作为一个CAN转发器,此器杵为总线和佶令速度高达1兆比特毎抄(Mbps)的CAN控制器分別捉供屋分发对能力 和差分接收能力.设计运行在特别恶劣的环境中,此器件特仃串线过压,27V至40V的接地损失保护和过热关 断,以及12V到12V的共模范|乩IS01050额定运行坏境温度范閑为-55°C至105°C =DW PACKAGEFUNCTION DIAGRAMDUB PACKAGEVcc1GND1RXD nc ncTXD GND1 GND1Vcc2 GND2 nc CANH CANL nc GND2 GND24-CANH CANLVcc1RXDTXDGND1Vcc2CANHCANLGND2Copyright © 2009-2011, Texas Instruments IncorporatedEnglish Data Sheet: SLLS983Copyright © 2009-2011, Texas Instruments IncorporatedEnglish Data Sheet: SLLS983DeviceNet is a trademark of others.Please be aware that an impoHant notice conceming availability. standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears a: the end of this data sheet.PRODUCTION DATA mformabon ts current as of pubiicaiion date. Products confoon to specif cations per the terms o< the Texas Instruments standard warranty. Production processing does not necessanly include tesbng ol all parameters.Copyright © 2009-2011, Texas Instruments IncorporatedEnglish Data Sheet: SLLS983IS01050y InstrumentsIS01050LZHCS321E - JUNE 2009-REVISED DECEMBER 2011This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions Failure to observe proper handling and installation procedures can cause damageESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.AVAILABLE OPTIONSPRODUCTRATED ISOLATIONPACKAGEMARKED ASORDERING NUMBERISO1050DUB2500 VRMSDUB-8ISO1050ISO1050DUB (rail) ISO1050DUBR (reel)ISO1050LDW 2500 VRMS DW-16IS01050LISO1050LDW (rail) ISO1050LDWR (reel)IS01050DW5000 VRMSDW-16ISO1050IS01050DW (rail) IS01050DWR (reel)(1) Product Preview(2) Certifiactions PendingABSOLUTE MAXIMUM RATINGSVALUE / UNITVCcv VcczSupply voltage -0.5 Vto6 VV)Voltage input (TXD)-0.5 Vto6 VVCANH or VCANh Voltage range at any bus terminal (CANH, CANL)-27 V to 40 VIoReceiver output current±15 mAESDHuman Body ModelJEDEC Standard 22. Method A114-C.01Bus pins and GND2±4 kVAll pins±4 kVCharged Device ModelJEDEC Standard 22. Test Method C101All pins±1.5 kVMachine ModelANSI/ESDS5.2-1996All pins±200 VTslgStorage temperature-65*C to 150*CTjJunction temperature-559 to 1509(1) Stresses beyond those listed under abso/ufp maximum ratings may cause parmanent damage to th© device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions Is not implied. Exposure to absolute-maximum-rated conditions tor extended periods may affect device reliabillty.(2) This isolator is suitable for basic isolation within the safety limiting data. Maintenanee of the safety data must be ensured by means of protective circuitry.(3) All Input and output logic voltage values are measured with respect to the GND1 logic side ground. Diflerentlal bus-side voltages are measured to the respective bus-side GND2 ground terminal.(4) Tested while connected between Vcc2 and GND2.RECOMMENDED OPERATING CONDITIONSMIN NOMMAXUNITVcciSupply voltage, controller side35.5VVCC2Supply voltage. bus side4.7555.25VVi or VicVoltage at bus pins (separately or common mode)-1212VV|HHigh-level input voltageTXD25.25VVlLLow-level input voltageTXD00.8VV|DDifferential input voltage-77VohHigh-level output currentDriver-70mAR eceiver-4IolLow-level output currentDriver70mAReceiver4TaAmbient Temperature-55105cTjJunction temperature (see THERMAL CHARACTERISTICS)-55125c(1) The algebraic convention in which the least positive (most n egative) limit is desig naled as minimum is used in this data sheet.#Copyright © 2009-2011, Texas Instruments Incorporated歩&MENTSwwwtLcomcnZHCS321E -JUNE 2009-REVISED DECEMBER 2011SUPPLY CURRENTover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMIN TYPMAXUNITIcciVcci Supply currentV| = 0 V or VCC1 .VCC1 = 3.3V1.828mAV, = 0 V or Vcci , Vcci = 5V2.33.6ICC2Vcc2 Supply currentDominantV, = 0 V, 60-Q Load5273mARecessiveVi Vcci812(1) All typical values are at 259 with Vcci Vcc2 5V.DEVICE SWITCHING CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDmONSMINTYPMAXUNIT<oop1Total loop delay, driver in put to receiver output. Recessive to DominantSee Figure 9112150210nsk>op2Total loop delay, driver input to receiver output, Dominant to RecessiveSee Figure 9112150210nsDRIVER ELECTRICAL CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMINTYPMAXUNITVo(d)Bus output voltage (Dominant)CANHSee Figure 1 and Figure 2, V| 0 V. Rl 60Q2.93.54.5wCANL0.81.21.5VVO(R)Bus output voltage (Recessive)See Figure 1 and Figure 2, V, - 2 V.60Q22.33VVOD(D)Differential output voltage (Dominant)See Figure 1, Figure 2 and Figure 3, V| = 0 V, Rl = 60Q1.53vSee Figure 1, Figure 2 and Figure 3 V| 0 V. Rl 45Q Vcc > 4.8V1.43vVOD(R)Differential output voltage (Recessive)See Figure 1 and Figure 2, Vt = 3 V. = 60Q-0.120.012vVi = 3 V. No Load-0.50.05VVgD)Common-mode output voltage (Dominant)See Figure 822.33vVOC(pp)Peak-to-peak common-mode output voltage0.3VI.HHigh level input current. TXD i叩utVj at 2 V5makLow-level input current, TXD inputVi at 0.8 V-5malo(o«)Power-off TXD leakage currentVCCb VCC2 at 0 V. TXD at 5 V10maSee Figure 11, Vcanf = -12 V, CANL Open-105-72oS(ss)Short-circuit steady-state output currentSee Figure 11,= 12 V, CANL Open0.361mASee Figure 11, Vcanl =-12 V? CANH Open-1-0.5See Figure 11,= 12 V, CANH Open71105CoOutput capacitanceSee receiver input caoacitanceCMTICommon-mode transient immunitySee Figure 13, V| = X/qq or 0 V2550kV/psDRIVER SWITCHING CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMINTYPMAXUNITtPLHPropagation delay time. recessivetodominant output3174110“HLPropagation delay time dominanttorecessive outputSee Figure 4254475ncVDifferential output signal rise time2050IIODifferential output signal tall time2050domDominant time-outCl=100 pF. See Figure 10300450700MSCopyright © 2009-2011, Texas Instruments Incorporated3y InstrumentsIS01050IS01050LZHCS321E - JUNE 2009-REVISED DECEMBER 2011RECEIVER ELECTRICAL CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMINTYPMAXUNITV|T>Positive-going bus input threshold voltageSee Table 1750900mVVlT-Negative-going bus input threshold voltage500650mVV”Hysteresis voltage (V Vq)150mVVOHHigh-level output voltage with Vcc = 5VIoh « -4 mA. See Ficure 6Vcc - 0.84.6vIoh = -20 叭 See Figure 6Vcc 0.15VVOHHigh-level output voltage with Vcc1 = 3.3VIOl 4 mA. See Figure 6Vcc -0.83.1vIol = 20 pA. See Figure 6Vcc - 0.13.3VLow-lovol output voltageIol = 4 mA. See Figure 60.20.4vVOLIol = 20 pA. See Figure 600.1VC|I叩ut capacitance to ground, (CANH or CANL)TXD at 3 V. V)= 0.4 sin (4E6nt) + 2.5V6PFC|DDiHerential input capacitanceTXD at 3 V, Vi - 0.4 sin (4E6nt)3PFridDitterential input resista neeTXD at3 V3080kQRinI叩ut resistance (CANH or CANL)TXD at 3 V153040kQRl(m)Input reslstanee matching(1 - Rn (CANH) / R|N (CANL)】)x00%VcANH VCANL-3%0%3%CMTICommon-mode transient immunityV| Vcc or 0 V. See Agure 132550kV/ps(1) All typical values are at 259 with Vcci = Vcc2 = 5V.RECEIVER SWITCHING CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMIN TYP MAXUNITtPLHPropagation delay time. Iow-to-high-level outputTXD at 3 V. See Figure 66690130nstpHLPropagation delay time high-to-low-level output5180105VOutput signal rise time36tfOutput signal fall time36幅Failsafe output delay time from bus side power lossVCC1 at 5 V. Sec Figure 126MOCopyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050Figure 1. Driver Voltage, Current and TestDefinitionsCANHTXD330 ft ±1%VW-160 Q±1%330 n ±1%(p -2V<Vtest<7VVGND2(SEE NOTE A)CANHCANL _60<±1%Figure 3. Driver VOd with Common-mode Loading Test CircuitVoIS01050LZHCS321E-JUNE 2009-REVISED DECEMBER 2011PARAMETER MEASUREMENT INFORMATIONFigure 2 Bus Logic State Voltage DefinitionsCopyright © 2009-2011, Texas Instruments Incorporated5y InstrumentsIS01050A. The 叩ut pulse is supplied by a generator having the following characteristics: PRR m 125 kHz 50% duty cycle, 匕 m 6 ns. m 6 ns, Zq = 50QB CL includes instrumentation and fixture capacitanee within ±20%Figure 4. Driver Test Circuit and Voltage WaveformsIS01050LZHCS321E - JUNE 2009-REVISED DECEMBER 2011PARAMETER MEASUREMENT INFORMATION (continued)Copyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050A. The npul pulse Is supplied by a generator having the following characteristics: PRR m 125 XH乙 50% duty cycle, 匕 m 6 ns. tf m 6 ns, Zq = 50QB Cl includes instrumentation and fixture capacitanee within ±20%Figure 6. Receiver Test Circuit and Voltage Waveforms1 nFTable 1. Differential Input Voltage Threshold TestINPUTOUTPUTVCANHVCANLIVidIR-11.1 V-12 V900 mVLVol12 V11.1 V900 mVL-6 V-12 V6 VL12 V6 V6 VL-11.5 V-12 V500 mVHVoh12 V11.5 V500 mVH-12 V-6 V-6 VH6 V12 V-6 VHOpenOpenXHThe waveforms of the applied transients are in accordancewith ISO 7637 part 1, test pulses 1, 2, 3a, and 3b.Figure 7. Transient Over-Voltage Test CircuitCopyright © 2009-2011, Texas Instruments Incorporated7y InstrumentsIS01050Figure 8 Peak-to-Peak Output Voltage Test Circuit and WaveformCANHCANL60 £2 ±1%TXD Input 50%-VccRXD OutputI I严loopj>屮looped50%X50%Figure 9. tLOop Test Circuit and Voltage Waveforms VoD(D)<dom -0VIS01050LZHCS321E-JUNE 2009-REVISED DECEMBER 2011Copyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050Copyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050A. The input pulse is supplied by a generator having the following characteristics: PRR m 125 kHz, 50% duty cycle. tr 6 ns. 6 ns. Zo = 50Q.B. CL includes Instrumentation and fixture capacitance within ±20%.Figure 10. Dominant Timeout Test Circuit and Voltage WaveformsCopyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050IS01050LFigure 11. Driver Short-Circuit Current Test Circuit and Waveformsv.VCC2 ?VCC20 VV0HVolFigure 12. Failsafe Delay Time Test Circuit and Voltage Waveforms9Copyright © 2009-2011, Texas Instruments Incorporatedy InstrumentsIS01050Figure 13. Common-Mode Transient Immunity Test CircuitHFigure 14. Electromagnetic Emissions Measurement SetupIS01050LZHCS321E-JUNE 2009-REVISED DECEMBER 2011Copyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050Copyright © 2009-2011, Texas Instruments Incorporated#y InstrumentsIS01050DEVICE INFORMATIONFUNCTION TABLEDRIVERRECEIVERINPUTSOUTPUTSBUS STATEDIFFERENTIAL INPUTS V)D = CANH-CANLOUTPUT RXDBUS STATETXDCANHCANLLHLDOMINANTV,D 之 0.9 VLDOMINANTHzzRECESSIVE0.5 V < V|0 < 0.9 V?OpenzzRECESSIVEV,D m 0.5 VHRECESSIVEXzzRECESSIVEOpenHRECESSIVE(1) H = high level; L = low level; X = irreleva nt; ? = in determi nate: Z = high impedance(2) Logic low pulses to prevedominant time-out.IS01050LZHCS321E - JUNE 2009-REVISED DECEMBER 2011ISOLATOR CHARACTERISTICS over recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMINTYP MAXUNITL(IO1)Minimum air gap (Clearance)Shortest terminal to terminal distanee through air6.1mmL(IO2)Minimjm external tracking (Creepage)Shortest terminal to terminal distance across the package surfaceDUB-86.8mmL(IO1)Minimjm air gap (Clearance)Shortest terminal to terminal distanee through air8.34mmL(IO2)Minimjm external track!ng (Creepage)Shortest terminal to terminal distance across the package surfaceDW-168.10mmMinimjm Internal Gap (Internal Clearance)Distance through the insulation0.014mmRqIsolation resistanceInput to output. V|O m 500 V. all pins on each side of the barrier tied together creaUng a two-:erminal device, Tamb < 100*C>1012uInput to output V|0 = 500 V, 100eC uTamb Tamb max>10nQCqBarrier capacita neeV( s 0.4 sin (4E6nt)1.9pFCiInput capacitance to groundV( = 0.4 sin (4E6nt)1.3PF(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application Care should be taken to maintain the creepage and clearance distanee of a board design to ensure that the mounting pads of the isolator on the printed circuit board do not reduce this distance.(2) Creepage and clearance on a printed circuit board become equal according to the measurement techniques shown in the Isolation Glossary. Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications.INSULATION CHARACTERISTICSover recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSSPECIFICATIONUNITvMaximum working insulation,0RM voltage per IECISO1050DUB and ISO1050LDW560VpeakIS01050DW1200 Vpr Input to output test voltage per IECISO1050DUB and ISO1050LDWVpr = 1.875 x Viorm. t = 1 sec (100% production) Partial discharge < 5 pC1050VpeakIS01050DW2250Viotm Transient overvoltage per IECt = 60 sac (qualification)4000Vpeakt = 1 sec (100% production)Viso Isolation voltage per ULISO1050DUB and ISO1050LDWt - 60 sec (qualification)2500Vrmst = 1 sec (100% production)3000IS01050DWt 60 sec (qualification)4243Vrmst = 1 sec (100% production)5092RsIsolation voltage per ULV|0 = 500 V at Ts>109QPollution Degree2(1) For applications that require DC working voltages between GND1 and GND2. please contact Texas Instruments for further details.IEC 60664-1 RATINGSPARAMETERTEST CONDITIONSSPECIFICATIONBasic isolation croupMaterial groupIIInstallation classificationRated mains voltage m 150 VrmsHVRated mains voltage m 300 VrmsHllRated mains voltage m 400 VrmsHIRated mains voltage m 600 Vrms (IS01050DW only)MlRated mains voltage m 848 Vrms (IS01050DW only)IIS01050LZHCS321E-JUNE 2009-REVISED DECEMBER 2011IEC SAFETY LIMITING VALUESsafety limiting intends to prevent potential damage to the isolation barriee upon failure of input or output circuitry. A failure of the IO can allow low resistance to ground or the supply and. without current limiting dissipate sufficient power to overheat the die and damage the isolation barrier potentially leading to secondary system failuresPARAMETERTEST CONDITIONSMIN TYP MAXUNITsSafety input, output or supply currentDUB-80ja = 73.3 9/W. V| = 5.5 Vt Tj =1509, TA = 25*C310mAeJA = 73.3V| = 3.6 V, Tj = 150eC. TA = 259474DW-16Oja 76 C/W. Vi 5.5 V, Tj 1509, TA 259299mAeJA = 76 C/W, V, = 3.6 V, Tj = 1509, TA = 259457TsMaximum case temperature150cThe safety-limiting constraint is the absolute maximum junction temperature specified in the absolute maximum ratings table The power dissipation and junction-to-air thermal impedanee of the device installed in the applicatio n hardware determines the junction temperature. The assured juncti on-to-air thermal resista nee in the Thermal Characteristics table is that of a device in stalled on a High-K Test Board for Leaded Surface Mount Packages The power is the recomme nded maximum in put voltage times the current. The juncti on temperature is then the ambient temperature plus the power times the juncti on-to-air thermal resista nee.REGULATORY INFORMATIONVDETUVCSAULCertified according to DIN EN 60747-5-2Certified according to EN/ULCSA 60950-1Approved under CSA Component Acceptance Notice #5ARecognized under 1577 p'Component Recog nition ProgramBasic InsulabonTransient Overvoltage. 4000Surge Voltage. 4030 VpkMaximum WorKing Voltage. 1200 V你 (IS01050DW) anc560 Vpk (ISO1050DUB) ISO1050LDW certification is pendingIS01050DW:5000 /皿朋 Reinforced Insulation, 400 VRUS maximum working voltage 5000Basic Insulation,600 VRUS maximum working voltageISO1050DUB and IS01050LDW: 2500 VR>AS Reinforced Insulation. 400 VRUS maximum working voltage 2500 VR>AS Basic Insulation,600 VRUS maximum working vottage5000 Vrms Reinforced Insulation2 Means of Patient Protection at 125 Vrms per IEC 60601-1 (3rd Ed.)Double ProtectionISO1050DUB: 2500 VRUS IS01050DW: 3500 Vg 4243 Vrms Single Protection Certification pending ISO1050LDW Certificatio n pendingFile Number: 40016131Certificate Number: U8V 11 09 77311 000File Number: 220991File Number E181974(1) Production tested 二 3000 Vrms (ISO1050DUB and ISO1050LDW) and 5092 Vrms (IS01050DW) for 1 second In accordance with UL 1577.THERMAL INFORMATION (DUB-8 PACKAGE)over recommended operating conditions (unless otherwise noted)PARAMETERTEST CONDITIONSMIN TYPMAXUNIT9jaJun ction-to-airLow-K Thermal Resistance120c/wHigh-K Thermal Resistance73.3c/w9jbJunction-to-board thermal resistanceLow-K Thermal Resistance10.2c/wJunction-to-case thermal resistanceLow-K Thermal Resistance14.5c/wPDDevice power dissipationVCC1= 5.5V, VCC2= 5.25V. T105eC, RL= 60Q TXD input is a 500kHz 50%

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