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1、图2 所示是边界扫描测试应用的示意图。为了测试两个J TAG 设备的连接,首先将J TAG 设备1某个输出测试脚的BSC 置为高或低电平,输出至NDO,然后,让J TAG设备2 的输入测试脚来捕获（capture)从管脚输入的NDI 值,再通过测试数据通道将捕获到的数据输出至TDO,对比测试结果,即可快速准确的判断这两脚是否连接可靠 设计举例设计举例Notice yellow line4 Boundary-Scan:D3,D4,D5 and D6.Non Boundary-Scan SRAM D1.Non Boundary-Scan FLASH D2.Non Boundary-Scan D7.
2、Boundary-Scan ICD6,D3 and D 5 are OK.*D4 and FLAG are BAD.#Something wrong in-between D6 and D4.Notice green lineSingle lineH=Drive value for a Boundary Scan output cell.L=Drive value for a Boundary Scan output cell.1=Sense value for a Boundary Scan input cell.0=Sense value for a Boundary Scan input
3、 cell.Z=Disabled Boundary Scan output cell.X=Sense value for a Boundary Scan input cell unknown.-=No active Boundary Scan cells on the net.Nets A2 and A3 have some errors.*When A2 needs to go low,whilst A3 is high,error.*When A3 needs to go low,whilst A2 is high,error.#Bridge between nets A2 and A3.
4、INTER FAILWhere errorOne can select an address.One can Write data to this address.One can Read-back this data.If the same,OK;If wrong ERROR.Address are the stimuli only.Data is stimuli(write)as well as response(read).So the conclusions of address errors have to come from the Data response.ALE is Inp
5、ut for AND_D7 cluster(Boundary scan drives H,L).WRITE is Input for AND_D7 cluster(Boundary scan drives H,L).WR_HT is Output for AND_D7 cluster(Boundary scan sense 1,0).AND_D7Function(of AND_D7)is embedded in the test vectors.Thus the diagnose is only output oriented.ALE is Input for AND_D7 cluster(B
6、oundary scan drives H,L).WRITE is Input for AND_D7 cluster(Boundary scan drives H,L).WR_HT is Output for AND_D7 cluster(Boundary scan sense 1,0).FailureOn failure,the process is stopped,and an indication aboutthe place where the error occurred(failing address)is given.Status of a programming action
7、is given.In the case of the programming of a JEDEC file,the“bitmap”of the JEDEC file can be compared with the“bitmap”inside the PLD,and erroneous bits can be displayed.BTPG(引擎）Net List(CAD).JTNBSDL(BSD).DSH.SEL(DSH Location).GENPIL(Parts Information List)RUNBTPG_I.NIF(Net Information File).DIF(Devic
8、e Information File).BIL(BS Information List)ECN.APLBSXCompiler若.APL有問題,則要重新改:.NIF,.DIF,.BILBTPG_M.NIF(Net Information File).MCD(Memory Cluster Definition).BIL(BS Information List).APLBSXCompilerSDESLFBTPG_C.NIF(Net Information File).SDF(Signal Definition File).BIL(BS Information List).APLBSXCompiler.SLF(Signal Level File)ANDABCSDF:A 1 IB 2 IC 3 OBTPG.NIF(Net Information File).FSH(Flash Data Sheet).FSHSEL.APLBSXCompilerBTPG.NIF(Net Information File).SVFJEDECIEEE 1532.BIL(BS Information List).PRGRUN
《JTAG测试介绍》PPT课件
